Fault Detection and Classification (FDC)
Our InFrame®Syn@pse Insight provides uni-variate FDC and multi-variate FDC, the calculation and usage of process tunnels; equipment matching and chamber matching and much more. It can be thus become your Equipment Engineering System.
Yield Management
By using InFrame®Syn@pse Insight you get supported by the most comprehensive software providing insight into your front-end and back-end data. InFrame®Syn@pse Insight is able to correlate final test data and binning data together with electrical tests (PCM), defect measurement, any kind of metrology and processing tool data.
Supported by powerful visualization features, drill-down and data mining capabilities you get a fast and comprehensive into the potentials of your process.
Virtual Metrology (VM)
By using virtual metrology of our InFrame®Syn@pse Insight you are able to optimize your metrology steps by introducing dynamic wafer sampling. You are increasing the performance of your metrology tools and you are reducing effort of material transport within your factory.
Statistical Process Control (SPC)
Using SPC with our InFrame®Syn@pse Insight provides you access to the essential methodologies including support of the requirements according ISO 21747. In addition you are immediately able to enhance your SPC to more advanced process control (APC) methodologies on the same product.
Measurement System Analysis (MSA)
By applying the average and range method you are able to improve your measurement systems quality. Even for multi-site measurements. You are increasing the yield and the performance of your measurement systems (InFrame®Syn@pse Insight)
Equipment Integration (EI)
Use InFrame®Syn@pse Socket for equipment integration and you get access to your SECSII/GEM equipments and sensors, or to your equipment controllers. The integrated Interface-A ensures the most flexible access to your processing tools.
Data Collection
With InFrame®Syn@pse Archivist we are providing the most comprehensive data collection product available for the Semiconductor Industry. Due to our experience and projects within the industry we are integrating front-end and back-end data collection within one product. The product has low administrative efforts and is supporting the most relevant open-standards and product standards including on-line tool connection and data file-formats.
Success Stories and References