Virtual Metrology (VM)
Accelerated line throughput and increased measurement system utilization
The Virtual Metrology package within InFrame Synapse PCS provides prediction of measurements based on previous equipment data or measurements. By applying these capabilities the material flow can be optimized and measurement systems can be better utilized.
Statistical and mathematical diagnostics and modeling scenarios
Powerful data visualization
Correlation analysis
Extraction of relevant data and calculation of hypotheses
Applying hypotheses for result prediction
Powerful data collection and tracing capabilities
Powerful statistical and diagnostics features
Comprehensive equipment monitoring
Easy to integrate with existing factory-automation environment
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